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Telecon 20180228
Attending: Bill, Tom, Kris, Hannes, Shaul, Karl, Qi
Notes by : Qi
Agenda
- Telescope and Instrument I+T (Tomo and Bill)
- Tomo's slides (.pdf)
- Receiver, Bill Jones (.pdf)
- I&T, PICO specific, Bill (.pdf)
- Planck decontamination, cooling, and in-orbit checkout
- Focal Plane configuration + ADR location + GRASP update (Karl)
- Focal plane slides (.pdf)
- Adjusted system to alpha = 30, beta = 65.
- GRASP quick update. Slides just in case: grasp_status (.pdf)
Notes
- Planck decontamination, cooling, and in-orbit checkout
- Someone needed to write ~ 1 paragraph. Charles Lawrence suggested.
- From Bill:
- CPV (commissioning and performance verification) at L2
- Telemetry checkout, cryogenic check, normal receiver operation etc.
- For PICO, the best mode needs to be decided; spinning or spinning + precession; we have to spin to stabilize. Different spin rate is something interesting.
- baking primary during launch to remove water not part of CPV
- Passively cool, during the flight to L2
- Telescope and Instrument I+T (Bill):
- Receiver
- Planck, did not include a lot of stuff prior to 2005
- overview in page 1
- some periods below:
- Sep, 2005
- Cryogenic chain, delivered and tested
- Mar, 2006
- HFI focal plane integration, 2 K bath, 100 mK, less than a week of testing; primary goal, show cryogenic works; gross noise check
- May,2006
- cryogenic, photometry, cooling down to 40 K, measuring surface separation
- July,2006
- same run as above, to do calibration, 20 day period, not fully integrated system, 2K to 100 mK, nothing at room T
- Much longer time is better, 20 days is really risky
- may,2008
- final cool down, only time of fully integrated test
- not designed to do any useful testing, cold load in front of focal plane, T is not stable, so no noise testing
- may 2009
- launch
- I&T, PICO specific
- counting back from launch, overview
- T-4 years: devices level detectors
- T-3years: proving sub-k cryogenics, maybe spectroscopy and noise testing;
- the sooner you get integration tests, the better; example: problem related to wiring, you won’t know until you get the full integration
- Planck did not have HFI+LFI fully test; 100 mK, 4K, more natural to sepaerate
- Cryogenic photogrammetry of telescope and truss, very important for Planck
- T-2 years: entire cooling chain
- T-1years: require a proper chamber
- Details:
- T-3 years:
- full focal plane, not the entire cooling chain
- due to warm primary, be careful of how to mimic background operational conditions at L2
- 3 mK fluctuation on 3K, heater, pump helium back; 10% percent level; as if we are observing CMB, for non-linearity etc.
- no mirrors, find the right chamber, ~meter level, time being cold should not be less than 1 month
- Polarimetric calibration ● Spectroscopic calibration
- two runs because of some expectation of something not working
- Planck never measured Spectroscopic with mirrors
- Planck Polarimetric, used those obtained during device level testing; it’s tricky to do it with fully integrated system. Very difficult measurements
- Cryogenic photogrammetry of telescope and truss [Large 300-40K chamber, 1 mo], may have to do mirrors separately for PICO, 30K, 4K
- T-1 years:
- cool the whole thing down, long run
- Because of TES, optical loading, to see Psat
- If we convince ourselves that we can do Polarimetric calibration ● Spectroscopic calibration on the whole system, we should
- Shaul: depending on the size of chamber
- Bill: do the math, and believe device level testings
- Planck was lucky, given the limited time of fully integration testing.
- Shaul: polarization modulation efficiency, one would calculate well based on the testings without mirrors.
- Bill: angular calibration, independent may be demanding.
- constrained bandpass mismatch, using data itself. It’s a big question to reach r<10^-4.
- 2 month is the tight. sort of Planck schedule. better to add 1 month to do testing, not sure the cost.
- in flight correction of HFI, the challenge is it’s difficult to do spectroscopy tests on the whole, which are in fact dependent on the whole system.
- cost, driver, 3 level of testing set ups
- modest, device, institutions
- large, full focal plane, calibration equatment needed, time needed
- 3rd, big chamber, fully integrated, time and calibration we want to test.
- Timing is likely to drive the cost
Last modified: 2018/02/28 16:27 by kyoung

